Practical Measurement of the Energy Resolution for meV-Resolved Inelastic X-ray Scattering
Daisuke Ishikawa, Alfred Q.R. Baron

TL;DR
This paper evaluates methods to measure the energy resolution of meV-resolved inelastic X-ray scattering spectrometers, comparing experimental approaches and analyzing inelastic contributions to improve accuracy.
Contribution
It introduces a comprehensive approach to determine the energy resolution using multiple materials and self-consistent analysis, enhancing measurement accuracy for IXS spectrometers.
Findings
Good agreement between PMMA, Tempax, and aluminum measurements over +-15 meV.
The resolution can be efficiently determined from a single scan using the developed method.
Proper deconvolution of the resolution function significantly affects spectrum analysis.
Abstract
We compare several different ways of measuring the energy resolution for meV-resolved inelastic x-ray scattering (IXS): using scattering from poly(methyl methacrylate), PMMA, using scattering from borosilicate glass (Tempax), and using powder diffraction from aluminum. All of these methods provide a reasonable first approximation to the energy resolution, but, also, in all cases, inelastic contributions appear over some range of energy transfers. Over a range of +-15 meV energy transfer there is good agreement between the measurements of PMMA and Tempax at low temperature, and room temperature powder diffraction from aluminum so we consider this to be a good indication of the true resolution of our ~1.3 meV spectrometer. We self-consistently determine the resolution over a wider energy range using the temperature, momentum and sample dependence of the measured response. We then…
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Taxonomy
TopicsX-ray Spectroscopy and Fluorescence Analysis · Radiation Shielding Materials Analysis · Crystallography and Radiation Phenomena
