Imaging graphene moir\'e superlattices via scanning Kelvin probe microscopy
Junxi Yu, Rajiv Giridharagopal, Yuhao Li, Kaichen Xie, Jiangyu Li,, Ting Cao, Xiaodong Xu, David S. Ginger

TL;DR
This study uses scanning Kelvin probe microscopy to map local surface potentials in twisted double bilayer graphene moiré superlattices, revealing stacking-dependent electronic properties and providing a stable imaging method for domain visualization.
Contribution
It introduces SKPM as a stable technique to distinguish stacking domains in moiré superlattices and correlates surface potential differences with electronic structure variations.
Findings
ABCA domains have ~15 mV higher surface potential than ABAB domains
Surface potential mapping is more stable than LPFM for visualizing moiré patterns
Density functional theory explains work function differences based on stacking
Abstract
Moir\'e superlattices in van der Waals heterostructures are gaining increasing attention because they offer new opportunities to tailor and explore unique electronic phenomena when stacking 2D materials with small twist angles. Here, we reveal local surface potentials associated with stacking domains in twisted double bilayer graphene (TDBG) moir\'e superlattices. Using a combination of both lateral Piezoresponse Force Microscopy (LPFM) and Scanning Kelvin Probe Microscopy (SKPM), we distinguish between Bernal (ABAB) and rhombohedral (ABCA) stacked graphene and directly correlate these stacking configurations with local surface potential. We find that the surface potential of the ABCA domains is ~15 mV higher (smaller work function) than that of the ABAB domains. First-principles calculations based on density functional theory further show that the different work functions between ABCA…
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