Electron beam transverse phase space tomography using nanofabricated wire scanners with submicrometer resolution

TL;DR

This paper introduces a novel nanofabricated wire scanner technique for high-resolution transverse phase space tomography of electron beams, enabling precise characterization at micrometer scales crucial for advanced accelerator applications.

Contribution

The paper presents a new method employing nanofabricated wires and a tomographic algorithm to reconstruct the transverse phase space of electron beams with submicrometer resolution.

Findings

Successfully characterized micrometer-sized electron beams at SwissFEL

Achieved reliable phase space reconstruction using the proposed method

Demonstrated applicability for advanced accelerator beam diagnostics

Abstract

Characterization and control of the transverse phase space of high-brightness electron beams is required at free-electron lasers or electron diffraction experiments for emittance measurement and beam optimization as well as at advanced acceleration experiments. Dielectric laser accelerators or plasma accelerators with external injection indeed require beam sizes at the micron level and below. We present a method using nano-fabricated metallic wires oriented at different angles to obtain projections of the transverse phase space by scanning the wires through the beam and detecting the amount of scattered particles. Performing this measurement at several locations along the waist allows assessing the transverse distribution at different phase advances. By applying a novel tomographic algorithm the transverse phase space density can be reconstructed. Measurements at the ACHIP chamber at SwissFEL confirm that the transverse phase space of micrometer-sized electron beams can be reliably characterized using this method.