High resolution, High contrast optical interface for defect qubits
Jong Sung Moon, Haneul Lee, Jin Hee Lee, Woong Bae Jeon, Dowon Lee,, Junghyun Lee, Seoyoung Paik, Sang-Wook Han, Rolf Reuter, Andrej Denisenko,, Joerg Wrachtrup, Sang-Yun Lee, Je-Hyung Kim

TL;DR
This paper introduces a microsphere-assisted confocal microscopy technique that significantly enhances the resolution and contrast of optical imaging for defect qubits in crystals, enabling better quantum control.
Contribution
It presents a simple, off-the-shelf micro-optics method that improves spatial resolution and signal-to-noise ratio for defect imaging without complex fabrication.
Findings
Achieved spatial resolution up to ~λ/5.
Fourfold increase in optical signal-to-noise ratio.
Enabled individual optical addressing of defect spins.
Abstract
Point defects in crystals provide important building blocks for quantum applications. To initialize, control, and read-out their quantum states, an efficient optical interface for addressing defects with photons is required. However, conventional confocal fluorescence microscopy with high refractive index crystals has limited photon collection efficiency and spatial resolution. Here, we demonstrate high resolution, high contrast imaging for defects qubits using microsphere-assisted confocal microscopy. A microsphere provides an excellent optical interface for point defects with a magnified virtual image that improves spatial resolution up to ~/5 as well as an optical signal-to-noise ratio by four times. These features enable individual optical addressing of single photons and single spins of spatially-unresolved defects in conventional confocal microscopy with improved signal…
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