Accurate Extraction of Schottky Barrier Height and Universality of Fermi Level De-pinning of van der Waals Contacts
Krishna Murali, Medha Dandu, Kenji Watanabe, Takashi Taniguchi, and, Kausik Majumdar

TL;DR
This paper introduces a simple method to accurately measure Schottky barrier heights at van der Waals contacts, revealing their universal de-pinned nature and demonstrating improved ambipolar carrier injection for optoelectronic applications.
Contribution
It proposes a novel technique for precise SBH extraction at vdW interfaces and demonstrates the universal de-pinning behavior across various materials.
Findings
vdW contacts exhibit universal de-pinned Fermi levels
The new technique accurately estimates SBH, reducing ambiguities
vdW contacts enable superior ambipolar carrier injection in devices
Abstract
Due to Fermi level pinning (FLP), metal-semiconductor contact interfaces result in a Schottky barrier height (SBH), which is usually difficult to tune. This makes it challenging to efficiently inject both electrons and holes using the same metal - an essential requirement for several applications, including light-emitting devices and complementary logic. Interestingly, modulating the SBH in the Schottky-Mott limit of de-pinned van der Waals (vdW) contacts becomes possible. However, accurate extraction of the SBH is essential to exploit such contacts to their full potential. In this work, we propose a simple technique to accurately estimate the SBH at the vdW contact interfaces by circumventing several ambiguities associated with SBH extraction. Using this technique on several vdW contacts, including metallic 2H-TaSe, semi-metallic graphene, and degenerately doped semiconducting…
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