Deep Photo Scan: Semi-Supervised Learning for dealing with the real-world degradation in Smartphone Photo Scanning
Man M. Ho, Jinjia Zhou

TL;DR
This paper introduces a semi-supervised deep learning approach called DPScan for improving smartphone photo scanning, addressing real-world degradation issues with a new dataset, local alignment, and degradation simulation.
Contribution
The paper presents a novel semi-supervised framework, real-world degradation modeling, and local alignment techniques for enhanced smartphone photo restoration.
Findings
Outperforms baseline and state-of-the-art methods in quality metrics.
Provides a new dataset DIV2K-SCAN for training and evaluation.
Effectively generalizes degradation styles through simulation and semi-supervised learning.
Abstract
Physical photographs now can be conveniently scanned by smartphones and stored forever as a digital version, yet the scanned photos are not restored well. One solution is to train a supervised deep neural network on many digital photos and the corresponding scanned photos. However, it requires a high labor cost, leading to limited training data. Previous works create training pairs by simulating degradation using image processing techniques. Their synthetic images are formed with perfectly scanned photos in latent space. Even so, the real-world degradation in smartphone photo scanning remains unsolved since it is more complicated due to lens defocus, lighting conditions, losing details via printing. Besides, locally structural misalignment still occurs in data due to distorted shapes captured in a 3-D world, reducing restoration performance and the reliability of the quantitative…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Code & Models
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsVisual Attention and Saliency Detection · Industrial Vision Systems and Defect Detection · Advanced Neural Network Applications
