Pulse-engineered Controlled-V gate and its applications on superconducting quantum device
Takahiko Satoh, Shun Oomura, Michihiko Sugawara, and Naoki Yamamoto

TL;DR
This paper introduces a pulse-engineered controlled-V gate for superconducting quantum devices, demonstrating significant reductions in gate time and fidelity improvements over traditional controlled-X gates, with applications to multi-qubit gates.
Contribution
The paper presents a novel pulse-engineered CV gate implementation that reduces gate time and enhances fidelity, enabling more efficient quantum computations on superconducting devices.
Findings
CV gate implemented in half the time of CX gate
Pulse-engineered CV gates improve fidelity and gate speed
Enhanced multi-qubit gate performance with CV gates
Abstract
In this paper, we demonstrate that, by employing OpenPulse design kit for IBM superconducting quantum devices, the controlled-V gate (CV gate) can be implemented in about half the gate time to the controlled-X (CX or CNOT gate) and consequently 65.5\% reduced gate time compared to the CX-based implementation of CV. Then, based on the theory of Cartan decomposition, we characterize the set of all two-qubit gates implemented with only two or three CV gates; using pulse-engineered CV gates enables us to implement these gates with shorter gate time and possibly better gate fidelity than the CX-based one, as actually demonstrated in two examples. Moreover, we showcase the improvement of linearly-coupled three-qubit Toffoli gate, by implementing it with the pulse-engineered CV gate, both in gate time and the averaged output-state fidelity. These results imply the importance of our CV gate…
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