Quantum Conductors Formation and Resistive Switching Memory Effects in Zirconia Nanotubes
A.S. Vokhmintsev, I.A. Petrenyov, R.V. Kamalov, I.A. Weinstein

TL;DR
This paper investigates the resistive switching properties of zirconia nanotube-based memristors, revealing quantized conductance states and mechanisms involving oxygen vacancy migration, which are promising for high-performance non-volatile memory devices.
Contribution
It introduces a novel zirconia nanotube memristor structure demonstrating quantized conductance and detailed switching mechanisms, advancing memristor technology.
Findings
Resistance ratio ≥ 3×10^4 between HRS and LRS
Conductance of LRS is quantized with a minimum of 0.5G_0
Resistive switching involves oxygen vacancy migration
Abstract
The development prospects of memristive elements for non-volatile memory with use of the metal-dielectric-metal sandwich structures with a thin oxide layer are due to the possibility of reliable forming the sustained functional states with quantized resistance. In the paper we study the properties of fabricated memristors based on the non-stoichiometric nanotubes in different resistive switching modes. Anodic oxidation of the foil has been used to synthesize a zirconia layer of thickness, consisting of an ordered array of vertically oriented nanotubes with outer diameter of 75 nm. sandwich structures have been fabricated by mask magnetron deposition. The effects of resistive switching in the memristors in unipolar and bipolar modes have been investigated. The resistance ratios between high-resistance (HRS) and…
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