Measurement of electric-field noise from interchangeable samples with a trapped-ion sensor

TL;DR

This paper demonstrates using a single trapped ion as a sensor to measure electric-field noise from different test surfaces, aiding in understanding noise sources affecting ion-trap quantum computing.

Contribution

It introduces a method to use a trapped ion as a versatile sensor for electric-field noise from interchangeable samples, advancing surface characterization techniques.

Findings

Measured electric-field noise magnitude and distance dependence from test surfaces.

Showed the feasibility of using a trapped ion sensor for surface noise characterization.

Potential to combine with other tools to understand noise mechanisms.

Abstract

We demonstrate the use of a single trapped ion as a sensor to probe electric-field noise from interchangeable test surfaces. As proof of principle, we measure the magnitude and distance dependence of electric-field noise from two ion-trap-like samples with patterned Au electrodes. This trapped-ion sensor could be combined with other surface characterization tools to help elucidate the mechanisms that give rise to electric-field noise from ion-trap surfaces. Such noise presents a significant hurdle for performing large-scale trapped-ion quantum computations.