Tailoring Infrared Absorption and Thermal Emission with Ultrathin-film Interferences in Epsilon-Near-Zero Media
Ben Johns, Shashwata Chattopadhyay, Joy Mitra

TL;DR
This paper uses simulations to explore how ultrathin epsilon-near-zero films can be engineered to control infrared absorption and thermal emission through interference effects, enabling customizable optical coatings.
Contribution
It develops a physical model of ultrathin-film interference in ENZ media, revealing universal wave phenomena and guiding design for tailored infrared absorption and emission.
Findings
Identified wavelength and angular ranges for efficient ENZ absorption and emission.
Developed a model explaining resonant interferences below quarter-wavelength thickness.
Demonstrated control over spectral and directional properties of thermal radiation.
Abstract
Engineering nanophotonic mode dispersions in ultrathin, planar structures enables significant control over infrared perfect absorption (PA) and thermal emission characteristics. Here, using simulations, the wavelength and angular ranges over which ultrathin, low loss, epsilon-near-zero (ENZ) films on a reflecting surface most efficiently absorb and re-radiate are identified, and the design parameters that tailor the ENZ mode dispersion within these limits are investigated. While the absorption is spectrally limited to wavelengths where the refractive index () lies below unity, the angular limits are determined by the ENZ material dispersion in this range. A model of ultrathin-film interference is developed to provide physical insight into the absorption resonances in this regime, occurring well below the conventional quarter-wavelength thickness limit. Driven by non-trivial phase…
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