Direct Opto-Electronic Imaging of 2D Semiconductor - 3D Metal Buried Interfaces

TL;DR

This study introduces a novel optical and electrical characterization method for buried 2D semiconductor-metal interfaces, revealing how fabrication conditions influence contact resistance and interface properties with nanoscale resolution.

Contribution

The paper presents a new technique combining metal-assisted transfer and scanning probe methods to directly analyze buried 2D semiconductor-metal interfaces at sub-20 nm resolution.

Findings

Direct evaporation of Au induces ~5% strain in MoS2

Contact resistance achieved as low as 63 kohm-um

Interface properties are highly sensitive to fabrication methods

Abstract

The semiconductor-metal junction is one of the most critical factors for high performance electronic devices. In two-dimensional (2D) semiconductor devices, minimizing the voltage drop at this junction is particularly challenging and important. Despite numerous studies concerning contact resistance in 2D semiconductors, the exact nature of the buried interface under a three-dimensional (3D) metal remains unclear. Herein, we report the direct measurement of electrical and optical responses of 2D semiconductor-metal buried interfaces using a recently developed metal-assisted transfer technique to expose the buried interface which is then directly investigated using scanning probe techniques. We characterize the spatially varying electronic and optical properties of this buried interface with < 20 nm resolution. To be specific, potential, conductance and photoluminescence at the buried metal/MoS$_2$ interface are correlated as a function of a variety of metal deposition conditions as well as the type of metal contacts. We observe that direct evaporation of Au on MoS$_2$ induces a large strain of ~5% in the MoS$_2$ which, coupled with charge transfer, leads to degenerate doping of the MoS$_2$ underneath the contact. These factors lead to improvement of contact resistance to record values of 138 kohm-um, as measured using local conductance probes. This approach was adopted to characterize MoS$_2$-In/Au alloy interfaces, demonstrating contact resistance as low as 63 kohm-um. Our results highlight that the MoS$_2$/Metal interface is sensitive to device fabrication methods, and provides a universal strategy to characterize buried contact interfaces involving 2D semiconductors.