Precision measurements of electric-field-induced frequency displacements of an ultranarrow optical transition in ions in a solid

TL;DR

This paper presents precise measurements of how electric fields shift the ultranarrow optical transition frequencies of Eu^{3+} ions in Y_2SiO_5, providing valuable data for quantum information and laser stabilization applications.

Contribution

The study offers the most accurate linear Stark coefficients for Eu^{3+} ions in Y_2SiO_5, including site-specific values and an upper limit for quadratic Stark shifts.

Findings

Electric field sensitivity varies by a factor of seven between two ion sites.

Linear Stark coefficients are measured with unprecedented accuracy.

Upper limit for quadratic Stark shift is established.

Abstract

We report a series of measurements of the effect of an electric field on the frequency of the ultranarrow linewidth $^7F_0 \rightarrow$ $^5D_0$ optical transition of $\rm Eu^{3+}$ ions in an $\rm Y_2SiO_5$ matrix at cryogenic temperatures. We provide linear Stark coefficients along two dielectric axes and for the two different substitution sites of the $\rm Eu^{3+}$ ions, with an unprecedented accuracy, and an upper limit for the quadratic Stark shift. The measurements, which indicate that the electric field sensitivity is a factor of seven larger for site 1 relative to site 2 for a particular direction of the electric field are of direct interest both in the context of quantum information processing and laser frequency stabilization with rare-earth doped crystals, in which electric fields can be used to engineer experimental protocols by tuning transition frequencies.