TL;DR
This paper introduces a machine learning and topological data analysis-based materials fingerprinting method that accurately classifies atomic structures in noisy, sparse datasets from atom probe tomography, aiding materials discovery.
Contribution
It presents a novel fingerprinting approach combining machine learning and topology to classify atomic structures in noisy datasets, advancing materials analysis capabilities.
Findings
Accurately classifies BCC and FCC structures despite noise
Demonstrates potential for extracting detailed structural information
Provides a foundation for analyzing complex material datasets
Abstract
Significant progress in many classes of materials could be made with the availability of experimentally-derived large datasets composed of atomic identities and three-dimensional coordinates. Methods for visualizing the local atomic structure, such as atom probe tomography (APT), which routinely generate datasets comprised of millions of atoms, are an important step in realizing this goal. However, state-of-the-art APT instruments generate noisy and sparse datasets that provide information about elemental type, but obscure atomic structures, thus limiting their subsequent value for materials discovery. The application of a materials fingerprinting process, a machine learning algorithm coupled with topological data analysis, provides an avenue by which here-to-fore unprecedented structural information can be extracted from an APT dataset. As a proof of concept, the material fingerprint…
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