MAVIREC: ML-Aided Vectored IR-DropEstimation and Classification
Vidya A. Chhabria, Yanqing Zhang, Haoxing Ren, Ben Keller, Brucek, Khailany, and Sachin S. Sapatnekar

TL;DR
MAVIREC employs machine learning techniques to efficiently identify worst-case IR drop vectors and accurately predict IR drop, significantly reducing analysis time while improving coverage and precision in chip power integrity assessment.
Contribution
It introduces a novel ML-based approach using 3D convolutions for vectored IR drop analysis, outperforming traditional heuristics and industrial methods in speed and accuracy.
Findings
Profiles 100K-cycle vectors in under 30 minutes
Achieves better coverage than existing industrial flow
Provides IR drop predictions with 10x speedup and under 4mV RMSE
Abstract
Vectored IR drop analysis is a critical step in chip signoff that checks the power integrity of an on-chip power delivery network. Due to the prohibitive runtimes of dynamic IR drop analysis, the large number of test patterns must be whittled down to a small subset of worst-case IR vectors. Unlike the traditional slow heuristic method that select a few vectors with incomplete coverage, MAVIREC uses machine learning techniques -- 3D convolutions and regression-like layers -- for accurately recommending a larger subset of test patterns that exercise worst-case scenarios. In under 30 minutes, MAVIREC profiles 100K-cycle vectors and provides better coverage than a state-of-the-art industrial flow. Further, MAVIREC's IR drop predictor shows 10x speedup with under 4mV RMSE relative to an industrial flow.
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