Sub-60 mV/decade switching in a metal-insulator-metal-insulator-semiconductor transistor without ferroelectric component

TL;DR

This study demonstrates sub-60 mV/decade switching in a WS2 MIMIS transistor without ferroelectric materials, attributing the steep slope to internal gate dynamics rather than ferroelectric effects, thus questioning the interpretation of such switching.

Contribution

It reveals that sub-60 mV/decade switching can occur due to internal gate effects in non-ferroelectric devices, challenging the assumption that such switching indicates ferroelectricity or true steep-slope behavior.

Findings

Sub-60 mV/decade switching observed without ferroelectric components.

Internal gate voltage response explains the steep-slope behavior.

Measurement artifacts can mimic steep-slope switching.

Abstract

Negative capacitance field-effect transistors (NC-FETs) have attracted wide interest as promising candidates for steep-slope devices, and sub-60 mV/decade switching has been demonstrated in NC-FETs with various device structures and material systems. However, the detailed mechanisms of the observed steep-slope switching in some of these experiments are under intense debate. Here we show that sub-60 mV/decade switching can be observed in a WS2 transistor with a metal-insulator-metal-insulator-semiconductor (MIMIS) structure - without any ferroelectric component. This structure resembles an NC-FET with internal gate, except that the ferroelectric layer is replaced by a leaky dielectric layer. Through simulations of the charging dynamics during the device characterization using an RC network model, we show that the observed steep-slope switching in our "ferroelectric-free" transistors can be attributed to the internal gate voltage response to the chosen varying gate voltage scan rates. We further show that a constant gate voltage scan rate can also lead to transient sub-60 mV/decade switching in an MIMIS structure with voltage dependent internal gate capacitance. Our results indicate that the observation of sub-60 mV/decade switching alone is not sufficient evidence for the successful demonstration of a true steep-slope switching device and that experimentalists need to critically assess their measurement setups to avoid measurement-related artefacts.