$\gamma$-phase Inclusions as Common Defects in Alloyed $\beta$-(Al$_x$Ga$_{1\text{-}x}$)$_2$O$_3$ and Doped $\beta$-Ga$_2$O$_3$ Films
Celesta S. Chang, Nicholas Tanen, Vladimir Protasenko, Thaddeus J., Asel, Shin Mou, Huili Grace Xing, Debdeep Jena, David A. Muller

TL;DR
This study reveals that the thermodynamically-unstable $\gamma$-phase is a common defect in alloyed and doped $eta$-Ga$_2$O$_3$ films, influencing growth and defect dynamics, with implications for material properties and device performance.
Contribution
The paper demonstrates the ubiquity of $\gamma$-phase inclusions in $eta$-Ga$_2$O$_3$ films and elucidates their formation mechanism and relation to growth conditions and defect diffusion.
Findings
$\gamma$-phase inclusions are common in $eta$-Ga$_2$O$_3$ films.
Growth temperature influences $\gamma$-phase layer thickness.
Ga interstitials are involved in $\gamma$-phase growth.
Abstract
-GaO is a promising ultra-wide bandgap semiconductor whose properties can be further enhanced by alloying with Al. Here, using atomic-resolution scanning transmission electron microscopy (STEM), we find the thermodynamically-unstable -phase is a ubiquitous defect in both -(AlGa)O films and doped -GaO films grown by molecular beam epitaxy. For undoped -(AlGa)O films we observe -phase inclusions between nucleating islands of the -phase at lower growth temperatures (~400-600 C). In doped -GaO, a thin layer of the -phase is observed on the surfaces of films grown with a wide range of n-type dopants and dopant concentrations. The thickness of the -phase layer was most strongly correlated with the growth temperature, peaking at about…
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Taxonomy
TopicsGa2O3 and related materials · Advanced Photocatalysis Techniques · Semiconductor materials and devices
