Topological defect engineering and PT-symmetry in non-Hermitian electrical circuits
Alexander Stegmaier, Stefan Imhof, Tobias Helbig, Tobias Hofmann,, Ching Hua Lee, Mark Kremer, Alexander Fritzsche, Thorsten Feichtner,, Sebastian Klembt, Sven H\"ofling, Igor Boettcher, Ion Cosma Fulga, Oliver G., Schmidt, Martin Greiter, Tobias Kiessling, Alexander Szameit

TL;DR
This paper demonstrates how electric circuit networks can be used to explore topological states in non-Hermitian systems with PT and anti-PT symmetries, revealing new topological phenomena and invariants.
Contribution
It introduces a method to study topological states in non-Hermitian circuits with PT and anti-PT symmetry, including measurement of admittance spectra and discovery of a novel PT symmetric Z2 invariant.
Findings
Realization of all three symmetry phases, including anti-PT symmetry.
Measurement of admittance spectrum and eigenstates under various boundary conditions.
Observation of the disappearance and reemergence of defect states depending on symmetry regime.
Abstract
We employ electric circuit networks to study topological states of matter in non-Hermitian systems enriched by parity-time symmetry and chiral symmetry anti- (). The topological structure manifests itself in the complex admittance bands which yields excellent measurability and signal to noise ratio. We analyze the impact of symmetric gain and loss on localized edge and defect states in a non-Hermitian Su--Schrieffer--Heeger (SSH) circuit. We realize all three symmetry phases of the system, including the symmetric regime that occurs at large gain and loss. We measure the admittance spectrum and eigenstates for arbitrary boundary conditions, which allows us to resolve not only topological edge states, but also a novel symmetric invariant of the bulk. We discover the distinct properties…
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