X-ray verification of sol-gel resist shrinkage in substrate-conformal imprint lithography for a replicated blazed reflection grating
Jake A. McCoy, Marc A. Verschuuren, Drew M. Miles, Randall L., McEntaffer

TL;DR
This study uses X-ray techniques to analyze how resist shrinkage during sol-gel substrate-conformal imprint lithography affects the surface profile and diffraction efficiency of large-area blazed gratings for soft X-ray applications.
Contribution
It provides the first detailed characterization of sol-gel resist shrinkage effects on blazed gratings fabricated by SCIL, linking process parameters to optical performance.
Findings
Resist shrinkage causes approximately 2° reduction in blaze angle.
Shrinkage impacts diffraction efficiency and blaze response.
Results inform optimization of imprinting process for X-ray optics.
Abstract
Surface-relief gratings fabricated through nanoimprint lithography (NIL) are prone to topographic distortion induced by resist shrinkage. Characterizing the impact of this effect on blazed diffraction efficiency is particularly important for applications in astrophysical spectroscopy at soft x-ray wavelengths (~nm) that call for the mass-production of large-area grating replicas with sub-micron, sawtooth surface-relief profiles. A variant of NIL that lends itself well for this task is substrate-conformal imprint lithography (SCIL), which uses a flexible, composite stamp formed from a rigid master template to imprint nanoscale features in an inorganic resist that cures thermodynamically through a silica sol-gel process. While SCIL enables the production of several hundred imprints before stamp degradation and avoids many of the detriments associated with…
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