Advances in Crystallographic Image Processing for Scanning Probe Microscopy
Peter Moeck

TL;DR
This chapter reviews advances in crystallographic image processing (CIP) for scanning probe microscopy (SPM), highlighting improvements in image quality, tip shape correction, and symmetry detection since 2010, enhancing the analysis of 2D periodic arrays.
Contribution
It introduces new computational methods for sharpening SPM images, including tip shape correction and symmetry detection using adapted Akaike Information Criterion.
Findings
Enhanced signal-to-noise ratio in SPM images
Effective removal of tip effects in 2D arrays
Application of geometric Akaike Information Criterion
Abstract
This book chapter reviews progress in crystallographic image processing (CIP) for scanning probe microscopy (SPM) that has occurred since our description of the technique was first put into open access in this book series in the year 2010. The signal to noise ratio in all kinds of experimental images of more or less regular 2D periodic arrays is significantly enhanced by CIP and the technique is independent of the type of recording device. In the SPM imaging context, CIP can be understood as an a posteriori sharpening of the effective experimental scanning probe tip by computational means. It is now possible to remove multiple scanning probe mini-tip effects in images from 2D periodic arrays of physical objects that either self-assembled or were created artificially. Accepted within the scientific community is by now also the fact that SPM tips can change their shape and fine structure…
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