Fabrication, characterization, and simulation of glass devices with AlN-thin-film-transducers for excitation of ultrasound resonances
Andr\'e G. Steckel, Henrik Bruus, Paul Muralt, Ramin Matloub

TL;DR
This study demonstrates the fabrication and characterization of glass devices with AlN thin-film transducers, achieving highly accurate simulation of ultrasound resonance frequencies through finite-element modeling and parameter optimization.
Contribution
It introduces a method for precise in-situ determination of acoustic parameters of elastic solids using thin-film transducers and FEM simulations.
Findings
Resonance frequencies closely match simulations with optimized material parameters.
Finite-element model accuracy improves significantly after parameter optimization.
The method enables accurate acoustic characterization of elastic solids.
Abstract
We present fabrication of 570-um-thick, millimeter-sized soda-lime-silicate float glass blocks with a 1-um-thick AlN-thin-film piezoelectric transducer sandwiched between thin metallic electrodes and deposited on the top surface. The electro-mechanical properties are characterized by electrical impedance measurements in the frequency range from 0.1 to 10 MHz with a peak-to-peak voltage of 0.5 V applied to the electrodes. We measured the electrical impedance spectra of 35 devices, all of width 2 mm, but with 9 different lengths ranging from 2 to 6 mm and with 2-7 copies of each individual geometry. Each impedance spectrum exhibits many resonance peaks, of which we carefully measured the 5 most prominent ones in each spectrum. We compare the resulting 173 experimental resonance frequencies with the simulation result of a finite-element-method model that we have developed. When using…
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