Low-frequency critical current noise in graphene Josephson junctions in the open-circuit gate voltage limit

TL;DR

This paper studies low-frequency critical current noise in graphene Josephson junctions, revealing flicker noise behavior and a unique temperature dependence at charge neutrality, advancing understanding of noise mechanisms in these devices.

Contribution

It introduces the analysis of critical current noise in graphene Josephson junctions within the open-circuit gate voltage limit, highlighting a novel temperature dependence at charge neutrality.

Findings

Flicker noise observed over a wide frequency range

Temperature dependence of noise amplitude varies with doping level

At charge neutrality, noise follows a T^{-3} dependence

Abstract

We investigate critical current noise in short ballistic graphene Josephson junctions in the open-circuit gate-voltage limit within the McWorther model. We find flicker noise in a wide frequency range and discuss the temperature dependence of the noise amplitude as a function of the doping level. At the charge neutrality point we find a singular temperature dependence $T^{-3}$, strikingly different from the linear dependence expected for short ballistic graphene Josephson junctions under fixed gate voltage.