Observation of zero-field transverse resistance in AlO$_x$/SrTiO$_3$ interface devices
P.W. Krantz, V. Chandrasekhar

TL;DR
This study reports the discovery of a zero-field transverse resistance in AlO$_x$/SrTiO$_3$ interface devices, linked to domain wall configurations and their temperature-dependent polarization, revealing new insights into interface transport phenomena.
Contribution
It introduces the observation of zero-field transverse resistance in AlO$_x$/SrTiO$_3$ interfaces and links it to domain wall effects and dielectric properties, a novel finding in oxide heterostructures.
Findings
Transverse resistance appears below ~70 K and grows below ~40 K.
Resistance varies with temperature, gate voltage, and position, and can change sign.
Larger transverse resistance observed in (111) oriented heterostructures.
Abstract
Domain walls in AlO/SrTiO (ALO/STO) interface devices at low temperatures give a rise to a new signature in the electrical transport of two-dimensional carrier gases formed at the surfaces or interfaces of STO-based heterostructures: a finite transverse resistance observed in Hall bars in zero external magnetic field. This transverse resistance depends on the local domain wall configuration and hence changes with temperature, gate voltage, thermal cycling and position along the sample, and can even change sign as a function of these parameters. The transverse resistance is observed below 70 K but grows and changes significantly below 40 K, the temperature at which the domain walls become increasingly polar. Surprisingly, the transverse resistance is much larger in (111) oriented heterostructures in comparison to (001) oriented heterostructures. Measurements of…
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