Evidence for Anti-Dowell-Schmerge Process in Photoemission from Diamond
Tanvi Nikhar, Sergey V. Baryshev, Gowri Adhikari, Andreas W. Schroeder

TL;DR
This paper reports the discovery of anti-Dowell-Schmerge behavior in diamond photocathodes, where the mean transverse energy decreases with photon energy, contrasting typical DS law predictions, with implications for high-brightness electron sources.
Contribution
It demonstrates that UNCD and diamond photocathodes exhibit anti-DS behavior, and shows how grain boundary engineering can switch their emission characteristics.
Findings
UNCD exhibits decreasing MTE with increasing photon energy.
Control over grain boundaries tunes the MTE behavior.
High QE and low MTE can be achieved simultaneously in UNCD.
Abstract
A great number of metal and semiconductor photocathodes, which are of high practical importance for photoinjector applications, closely follow the 1/3 gradient Dowell-Schmerge (DS) law describing the spectral dependence of the mean transverse energy (), as a function of the incident laser photon energy. However, some (rare) semiconductor photocathodes show trends that are significantly different. For example, spectral measurements on PbTe, BaLaSnO or Hf/HfO have clearly demonstrated trends that can differ from DS law being non-monotonic, slower growing, or displaying constant versus laser photon energy. We have discovered that -type ultra-nano-crystalline diamond (UNCD) and single crystal diamond are anti-DS photocathodes in that their decreases with the incident photon energy. It was previously established that UNCD is a highly emissive…
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Taxonomy
TopicsDiamond and Carbon-based Materials Research · Advanced Materials Characterization Techniques · Ion-surface interactions and analysis
