Spectral measurement of the breakdown limit of $\beta-Ga_{2}O_{3}$ and tunnel ionization of self-trapped excitons and holes
Md M. Adnan, Darpan Verma, Zhanbo Xia, Nidhin K. Kalarickal, Siddharth, Rajan, Roberto C. Myers

TL;DR
This study investigates the strong-field exciton and hole dynamics in $eta-Ga_{2}O_{3}$ using spectral measurements, revealing field-induced effects, breakdown detection, and tunnel ionization processes with novel quantitative models.
Contribution
It introduces a quantum mechanical model for tunnel ionization of self-trapped excitons and holes, providing new insights into high-field carrier transport in $eta-Ga_{2}O_{3}$.
Findings
Spectral red-shift saturates at dielectric breakdown threshold.
Field-dependent photocurrent explained by tunnel ionization of STH and STX.
Estimated ultrafast hole self-trapping time of 0.045 fs.
Abstract
is an unusual semiconductor where large electric fields (~1-6 MV/cm) can be applied while still maintaining a dominant excitonic absorption peak below its ultra-wide bandgap. This provides a rare opportunity in the solid-state to examine exciton and carrier self-trapping dynamics in the strong-field limit at steady-state. Under sub-bandgap photon excitation, we observe a field-induced red-shift of the spectral photocurrent peak associated with exciton absorption and threshold-like increase in peak amplitude at high-field associated with self-trapped hole ionization. The field-dependent spectral response is quantitatively fit with an eXciton-modified Franz-Keldysh (XFK) effect model, which includes the electric-field dependent exciton binding energy due to the quadratic Stark effect. A saturation of the spectral red-shift with reverse bias is observed exactly at the…
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