The assembly bias of emission line galaxies
Esteban Jimenez, Nelson Padilla, Sergio Contreras, Idit Zehavi,, Carlton Baugh, Alvaro Orsi

TL;DR
This study investigates the assembly bias and large-scale structure of emission-line galaxies (ELGs) using models and simulations, revealing scale-dependent bias and environmental effects that impact cosmological measurements.
Contribution
It provides the first detailed analysis of assembly bias signatures in ELGs selected by specific emission lines, highlighting their scale dependence and environmental influences.
Findings
ELG samples show scale-dependent bias on large scales.
Low metallicity ELGs are found in low-density regions.
BAO peak shifts slightly for [OII] emitters and the growth rate parameter β is scale-dependent.
Abstract
The next generation of spectroscopic surveys will target emission-line galaxies (ELGs) to produce constraints on cosmological parameters. We study the large scale structure traced by ELGs using a combination of a semi-analytical model of galaxy formation, a code that computes the nebular emission from HII regions using the properties of the interstellar medium, and a large-volume, high-resolution N-body simulation. We consider fixed number density samples where galaxies are selected by either their H, [OIII] or [OII] emission line luminosities. We investigate the assembly bias signatures of these samples, and compare them to those of stellar mass and SFR selected samples. Interestingly, we find that the [OIII]- and [OII]-selected samples display scale-dependent bias on large scales and that their assembly bias signatures are also…
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