A high-fidelity method for a single-step $N$-bit Toffoli gate in trapped ions
Juan Diego Arias Espinoza, Koen Groenland, Matteo Mazzanti, Kareljan, Schoutens, Rene Gerritsma

TL;DR
This paper presents a high-fidelity, single-step method for implementing multi-qubit Toffoli gates in trapped ions using adiabatic switching and spin-echo techniques, achieving over 99% fidelity for 3-7 ions within 1 ms.
Contribution
It introduces an adiabatic approach to mitigate entanglement issues in multi-qubit gates, enabling high-fidelity Toffoli gates in larger ion crystals.
Findings
Achieves >99% fidelity for 3-7 ion Toffoli gates
Gate time is below 1 millisecond
Effective even with imperfect ground state cooling
Abstract
Conditional multi-qubit gates are a key component for elaborate quantum algorithms. In a recent work, Rasmussen et al. (Phys. Rev. A 101, 022308) proposed an efficient single-step method for a prototypical multi-qubit gate, a Toffoli gate, based on a combination of Ising interactions between control qubits and an appropriate driving field on a target qubit. Trapped ions are a natural platform to implement this method, since Ising interactions mediated by phonons have been demonstrated in increasingly large ion crystals. However, the simultaneous application of these interactions and the driving field required for the gate results in undesired entanglement between the qubits and the motion of the ions, reducing the gate fidelity. In this work, we propose a solution based on adiabatic switching of these phonon mediated Ising interactions. We study the effects of imperfect ground state…
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