Investigation of n-type dilute magnetic semiconductor property observed in amorphous AlNO alloy thin film incorporated with dilute nitrogen at 300K
Deena Nath, U.P. Deshpande, N. V. Chandra Shekar, Sujay Chakravarty

TL;DR
This study reports the synthesis and characterization of an amorphous AlNO alloy thin film that exhibits n-type dilute magnetic semiconductor properties at room temperature, combining experimental and theoretical analyses.
Contribution
It introduces a novel method to create n-type DMS at room temperature by nitrogen interstitial incorporation in Al2O3, supported by experimental and DFT calculations.
Findings
The film shows low resistivity and high carrier mobility at 300K.
Nitrogen prefers interstitial sites, inducing magnetic properties.
The study provides insights into room-temperature n-type DMS fabrication.
Abstract
In the present work, a thin film was deposited on quartz substrate by reactive RF magnetron sputtering of high purity (99.999%) aluminium target using ultra-high pure (Ar + N2) gas mixture. The percentage ratio of Ar and N2 in the gas mixture was 95% and 5%, respectively. Chemical characterization using x-ray photoelectron spectroscopy (XPS) and energy-dispersive xray (EDX) spectroscopy reveals that in the presence of dilute nitrogen, Al prefers to react with residual oxygen to form Al2O3 while the nitrogen is incorporated in it. The stoichiometry of bulk film is Al2N0.38O3.1. Magnetic and electrical properties measurement shows that the film exhibits ntype dilute magnetic semiconductor (DMS) property at 300K. The film has low electrical resistivity of 6.3 {\Omega}-cm and high carrier mobility of 5.7*106 cm2V-1s-1 at 300K. A density functional theory (DFT) calculation was performed to…
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Taxonomy
TopicsZnO doping and properties · Copper-based nanomaterials and applications · GaN-based semiconductor devices and materials
