Trends in the valence band electronic structures of mixed uranium oxides

TL;DR

This study investigates the valence band electronic structures of various mixed uranium oxides using RIXS and computational methods, demonstrating the technique's effectiveness in validating theoretical models.

Contribution

It introduces the use of RIXS at the U M5 edge combined with computational analysis to study uranium oxides' electronic structures.

Findings

RIXS effectively probes U 5f-O 2p charge transfer excitations.

The study validates theoretical approximations of electronic structures.

Different uranium oxides show distinct valence band features.

Abstract

Valence band electronic structure of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, UO3) has been studied by the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and by computational methods. We show here that the RIXS technique and recorded U 5f-O 2p charge transfer excitations can be used to proof the validity of theoretical approximations