$\textit{ab initio}$ description of bonding for transmission electron microscopy
Jacob Madsen, Timothy J. Pennycook, Toma Susi

TL;DR
This paper discusses the development and importance of ab initio electron scattering simulations in transmission electron microscopy, emphasizing their potential to provide more accurate insights by including valence bonding effects.
Contribution
It reviews recent advances in ab initio electron scattering simulations based on density functional theory, highlighting their growing relevance in high-resolution TEM analysis.
Findings
Ab initio simulations incorporate valence bonding effects.
Such simulations are increasingly feasible and valuable.
They enhance interpretation of subtle contrast differences.
Abstract
The simulation of transmission electron microscopy (TEM) images or diffraction patterns is often required to interpret their contrast and extract specimen features. This is especially true for high-resolution phase-contrast imaging of materials, but electron scattering simulations based on atomistic models are widely used in materials science and structural biology. Since electron scattering is dominated by the nuclear cores, the scattering potential is typically described by the widely applied independent atom model. This approximation is fast and fairly accurate, especially for scanning TEM (STEM) annular dark-field contrast, but it completely neglects valence bonding and its effect on the transmitting electrons. However, an emerging trend in electron microscopy is to use new instrumentation and methods to extract the maximum amount of information from each electron. This is evident…
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