Oxygen annealing induced changes in defects within beta-Ga2O3 epitaxial films measured using photoluminescence
Rujun Sun, Yu Kee Ooi, Praneeth Ranga, Arkka Bhattacharyya, Sriram, Krishnamoorthy, Michael A. Scarpulla

TL;DR
This study uses photoluminescence spectroscopy to investigate how oxygen annealing affects defect formation and optical emissions in beta-Ga2O3 epitaxial films, revealing defect-related energy levels and morphological changes.
Contribution
It provides new insights into defect dynamics and energy levels in beta-Ga2O3 films induced by oxygen annealing, with detailed activation energies and defect behavior analysis.
Findings
Decreased PL yield and UV intensity with higher annealing temperatures.
Increased blue/UV and green/UV emission ratios indicating defect formation.
Identification of defect activation energies and morphological changes at high temperatures.
Abstract
In this work, we use photoluminescence spectroscopy (PL) to monitor changes in the UV, UV', blue, and green emission bands from n-type (010) Ga2O3 films grown by metalorganic vapor phase epitaxy (MOVPE) induced by annealing at different temperatures under O2 ambient. Annealing at successively higher temperatures decreases the overall PL yield and UV intensity at nearly the same rates, indicating the increase in formation of at least one non-radiative defect type. Simultaneously, the PL yield ratios of blue/UV and green/UV increase, suggesting that defects associated with these emissions increase in concentration with O2 annealing. Utilizing the different absorption coefficients of 240 and 266 nm polarization-dependent excitation, we find an overall activation energy for the generation of non-radiative defects of 0.69 eV in the bulk but 1.55 eV near the surface. We also deduce activation…
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Taxonomy
TopicsGa2O3 and related materials · Advanced Photocatalysis Techniques · ZnO doping and properties
