Toward precise simulations of the coupled ultrafast dynamics of electrons and atomic vibrations in materials
Xiao Tong, Marco Bernardi

TL;DR
This paper introduces a first-principles, high-resolution simulation method for tracking coupled electron and phonon dynamics in materials over tens of picoseconds, providing detailed insights into ultrafast processes.
Contribution
It develops a novel, accurate simulation approach combining electron-phonon and phonon-phonon interactions to model ultrafast dynamics with femtosecond resolution.
Findings
Successfully simulated ultrafast electron and phonon dynamics in graphene.
Provided detailed insights into scattering mechanisms and transient optical responses.
Enabled structural and scattering pattern predictions for excited materials.
Abstract
Ultrafast spectroscopies can access the dynamics of electrons and nuclei at short timescales, shedding light on nonequilibrium phenomena in materials. However, development of accurate calculations to interpret these experiments has lagged behind as widely adopted simulation schemes are limited to sub-picosecond timescales or employ simplified interactions lacking quantitative accuracy. Here we show a precise approach to obtain the time-dependent populations of nonequilibrium electrons and atomic vibrations (phonons) up to tens of picoseconds, with a femtosecond time resolution. Combining first-principles electron-phonon and phonon-phonon interactions with a parallel numerical scheme to time-step the coupled electron and phonon Boltzmann equations, our method provides unprecedented microscopic insight into scattering mechanisms in excited materials. Focusing on graphene as a case study,…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsElectron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Surface and Thin Film Phenomena
