Optimal Testing of Discrete Distributions with High Probability
Ilias Diakonikolas, Themis Gouleakis, Daniel M. Kane, John, Peebles, Eric Price

TL;DR
This paper develops optimal algorithms for high-confidence testing of discrete distributions, including closeness and independence, providing tight bounds on sample complexity as a function of confidence and error parameters.
Contribution
It introduces the first sample-optimal algorithms for closeness and independence testing with high probability, extending the understanding of distribution testing complexity.
Findings
Provided sample-optimal algorithms for closeness and independence testing.
Established matching information-theoretic lower bounds for these testing problems.
Extended techniques to related distribution testing tasks.
Abstract
We study the problem of testing discrete distributions with a focus on the high probability regime. Specifically, given samples from one or more discrete distributions, a property , and parameters , we want to distinguish {\em with probability at least } whether these distributions satisfy or are -far from in total variation distance. Most prior work in distribution testing studied the constant confidence case (corresponding to ), and provided sample-optimal testers for a range of properties. While one can always boost the confidence probability of any such tester by black-box amplification, this generic boosting method typically leads to sub-optimal sample bounds. Here we study the following broad question: For a given property , can we {\em characterize} the sample…
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