TL;DR
This paper introduces phase sampling profilometry (PSP), a novel method for 3D shape measurement that unambiguously calculates phase from a single pattern, enabling robust single-shot 3D imaging of moving objects.
Contribution
The paper proposes PSP, a new approach that computes phase in the spatial-frequency domain using only one pattern, improving single-shot 3D measurement capabilities.
Findings
Enables unambiguous phase calculation from a single pattern.
Robustly measures 3D shapes of moving objects.
Achieves high-resolution, high-accuracy 3D imaging.
Abstract
Structured light 3D surface imaging is a school of techniques in which structured light patterns are used for measuring the depth map of the object. Among all the designed structured light patterns, phase pattern has become most popular because of its high resolution and high accuracy. Accordingly, phase measuring profolimetry (PMP) has become the mainstream of structured light technology. In this letter, we introduce the concept of phase sampling profilometry (PSP) that calculates the phase unambiguously in the spatial-frequency domain with only one pattern image. Therefore, PSP is capable of measuring the 3D shapes of the moving objects robustly with single-shot.
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Taxonomy
TopicsOptical measurement and interference techniques · Thermography and Photoacoustic Techniques · Advanced X-ray Imaging Techniques