Analysis of misidentifications in TEM characterization of perovskite material

TL;DR

This paper reviews common misidentifications in TEM analysis of perovskite materials, identifies their causes, and proposes strategies to improve phase identification and reduce radiation damage, thereby aiding accurate characterization of these sensitive materials.

Contribution

It provides a comprehensive summary of misidentification issues in TEM of perovskites, classifies their causes, and offers practical methods to improve phase detection and minimize damage.

Findings

Misidentifications often occur due to electron beam damage.

Classified causes of TEM misinterpretations in perovskite analysis.

Proposed strategies to reduce radiation damage and improve phase identification.

Abstract

Organic-inorganic hybrid perovskites (OIHPs) have recently emerged as groundbreaking semiconductor materials owing to their remarkable properties. Transmission electron microscopy (TEM), as a very powerful characterization tool, has been widely used in perovskite materials for structural analysis and phase identification. However, the perovskites are highly sensitive to electron beams and easily decompose into PbX2 (X= I, Br, Cl) and metallic Pb. The electron dose of general high-resolution TEM is much higher than the critical dose of MAPbI3, which results in universal misidentifications that PbI2 and Pb are incorrectly labeled as perovskite. The widely existed mistakes have negatively affected the development of perovskite research fields. Here misidentifications of the best-known MAPbI3 perovskite are summarized and corrected, then the causes of mistakes are classified and ascertained. Above all, a solid method for phase identification and practical strategies to reduce the radiation damage for perovskite materials have also been proposed. This review aims to provide the causes of mistakes and avoid misinterpretations in perovskite research fields in the future.