Artefact removal in ground truth and noise model deficient sub-cellular nanoscopy images using auto-encoder deep learning
Suyog Jadhav, Sebastian Acu\~na, Krishna Agarwal, Dilip K., prasad

TL;DR
This paper introduces a simulation-supervised deep learning auto-encoder approach for artefact removal in nanoscopy images, addressing the unique challenges posed by the lack of supervised datasets and explicit noise models.
Contribution
It presents a novel training method for deep auto-encoders tailored to nanoscopy images, demonstrating generalizability and analyzing limitations of current metrics.
Findings
Effective artefact removal demonstrated in nanoscopy images
Generalization across different structures and noise models
Insights into limitations of existing performance metrics
Abstract
Image denoising or artefact removal using deep learning is possible in the availability of supervised training dataset acquired in real experiments or synthesized using known noise models. Neither of the conditions can be fulfilled for nanoscopy (super-resolution optical microscopy) images that are generated from microscopy videos through statistical analysis techniques. Due to several physical constraints, supervised dataset cannot be measured. Due to non-linear spatio-temporal mixing of data and valuable statistics of fluctuations from fluorescent molecules which compete with noise statistics, noise or artefact models in nanoscopy images cannot be explicitly learnt. Therefore, such problem poses unprecedented challenges to deep learning. Here, we propose a robust and versatile simulation-supervised training approach of deep learning auto-encoder architectures for the highly…
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