Calibration of X-Ray Source of a Powder Diffractometer and Radiation Test of Silicon Microstrip Detectors

TL;DR

This paper presents a flexible calibration apparatus for the X-ray source in a powder diffractometer, achieving flux measurement accuracy within 5%, and applies it to radiation hardness testing of silicon microstrip detectors.

Contribution

The paper introduces a novel calibration method for X-ray flux in powder diffractometers and demonstrates its application in silicon detector radiation testing.

Findings

Flux range of 200-400 MHz with 5% uncertainty

Calibration method effective for radiation hardness studies

Validated calibration for high-voltage X-ray flux measurement

Abstract

A flexible apparatus for calibration of the absolute flux at the focal plane of the X-ray Source of a Powder Diffractometer, based on a fast scintillator counter, is presented. The measured fluxes, depending on the high voltage on the X-ray tube, were at the range 200 - 400 MHz, while an uncertainty in the flux of the order of 5% has been estimated. We also applied this calibration for radiation hardness study of a multichannel silicon microstrip X-Ray detector.