Determination of the sheet resistance of an infinite thin plate with five point contacts located at arbitrary positions
Krzysztof R. Szyma\'nski, Piotr A. Zaleski

TL;DR
This paper introduces a five-probe method for measuring sheet resistance in an infinite thin plate that remains accurate regardless of probe placement, useful for micro- and nanometric applications.
Contribution
It presents a novel five-probe measurement technique that is independent of probe positions for an infinite homogeneous plane.
Findings
Method is strictly valid for an infinite homogeneous plane.
Potential applications as a standard for sheet resistance measurement.
Effective for layers on objects with spherical topology.
Abstract
In this paper, a five-probe method of sheet resistance measurement that is independent of probe positions is reported. The method is strict for an infinite homogeneous plane. It has potential applications as a sheet resistance standard based on planar molecular layers. The method can be used to measure the sheet resistance of layers covering objects with a spherical topology, particularly on micro- and nanometric scales, where it is difficult to control probe positioning.
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