Origin of the hump anomalies in the Hall resistance loops of ultrathin SrRuO$_3$/SrIrO$_3$ multilayers
Lin Yang, Lena Wysocki, J\"org Sch\"opf, Lei Jin, Andr\'as Kov\'acs,, Felix Gunkel, Regina Dittmann, Paul H. M. van Loosdrecht, and Ionela, Lindfors-Vrejoiu

TL;DR
This study investigates the origin of hump anomalies in Hall resistance loops of ultrathin SrRuO3/SrIrO3 multilayers, suggesting they stem from electronic and magnetic differences rather than skyrmion formation.
Contribution
It demonstrates that hump anomalies in symmetric multilayers are due to intrinsic layer differences, challenging the assumption that they indicate skyrmions.
Findings
Hump anomalies appear in multilayers with multiple stacking.
Symmetric trilayers do not show hump anomalies.
Differences in layer properties, not skyrmions, explain the anomalies.
Abstract
The proposal that very small N\'eel skyrmions can form in SrRuO/SrIrO epitaxial bilayers and that the electric field-effect can be used to manipulate these skyrmions in gated devices strongly stimulated the recent research of SrRuO heterostructures. A strong interfacial Dzyaloshinskii-Moriya interaction, combined with the breaking of inversion symmetry, was considered as the driving force for the formation of skyrmions in SrRuO/SrIrO bilayers. Here, we investigated nominally symmetric heterostructures in which an ultrathin ferromagnetic SrRuO layer is sandwiched between large spin-orbit coupling SrIrO layers, for which the conditions are not favorable for the emergence of a net interfacial Dzyaloshinskii-Moriya interaction. Previously the formation of skyrmions in the asymmetric SrRuO/SrIrO bilayers was inferred from anomalous Hall resistance loops…
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