Response to comment on "Resolving spatial and energetic distributions of trap states in metal halide perovskite solar cells"

TL;DR

This paper defends the drive-level capacitance profiling (DLCP) method's ability to accurately measure trap state distributions in perovskite solar cells, countering previous criticisms about its resolution limitations.

Contribution

It clarifies that DLCP-derived trap densities are based on differential capacitance, effectively excluding background effects, and provides experimental evidence supporting DLCP's accuracy.

Findings

DLCP measures trap densities by differential capacitance, removing background effects.

Experimental data confirms DLCP accurately reflects trap distribution in perovskite solar cells.

Diffusion and geometric capacitance contributions are negligible or excluded in DLCP analysis.

Abstract

Ravishankar et al. claimed the drive-level capacitance profiling (DLCP) method cannot resolve trap density along depth direction in perovskites with given thickness, and explained the measured charges to be a consequence of geometrical capacitance and diffusion capacitance. We point out that the trap densities in DLCP method are derived from the differential capacitance at different frequencies, and thus the background charges caused by diffusion and geometry capacitance has been subtracted. Even for the non-differential doping analysis by DLCP, the contribution from diffusion capacitance is shown to be negligible and contribution from geometry capacitance is excluded. Additional experiment results further support the measured trap density represents the actual trap distribution in perovskite solar cells.