Atomic Resolution Imaging of CrBr$_{3}$ using Adhesion-Enhanced Grids

TL;DR

This paper introduces a scalable dry-stamping method with adhesion-enhanced grids for preparing clean, suspended 2D crystal specimens, enabling atomic resolution imaging of delicate materials like CrBr3.

Contribution

The authors develop a new support grid and dry-stamping technique that achieves 100% yield of clean, free-standing 2D specimens for high-resolution microscopy.

Findings

Successful atomic resolution imaging of CrBr3 defect structures

Demonstration of a scalable method for preparing 2D specimens

Enhanced preservation of air-sensitive 2D materials

Abstract

Suspended specimens of 2D crystals and their heterostructures are required for a range of studies including transmission electron microscopy (TEM), optical transmission experiments and nanomechanical testing. However, investigating the properties of laterally small 2D crystal specimens, including twisted bilayers and air sensitive materials, has been held back by the difficulty of fabricating the necessary clean suspended samples. Here we present a scalable solution which allows clean free-standing specimens to be realized with 100% yield by dry-stamping atomically thin 2D stacks onto a specially developed adhesion-enhanced support grid. Using this new capability, we demonstrate atomic resolution imaging of defect structures in atomically thin CrBr3, a novel magnetic material which degrades in ambient conditions.