Harnessing Interpretable and Unsupervised Machine Learning to Address Big Data from Modern X-ray Diffraction
Jordan Venderley, Michael Matty, Krishnanand Mallayya, Matthew, Krogstad, Jacob Ruff, Geoff Pleiss, Varsha Kishore, David Mandrus, Daniel, Phelan, Lekhanath Poudel, Andrew Gordon Wilson, Kilian Weinberger, Puspa, Upreti, Michael R. Norman, Stephan Rosenkranz, Ray Osborn

TL;DR
This paper introduces XRD Temperature Clustering (X-TEC), an unsupervised machine learning method that automatically analyzes large X-ray diffraction datasets to uncover complex electronic and structural phenomena in crystalline materials.
Contribution
The paper presents a novel unsupervised machine learning approach, X-TEC, capable of extracting order parameters and detecting intra-unit cell ordering from high-volume XRD data, advancing analysis of big data in materials science.
Findings
X-TEC successfully identified charge density wave order parameters.
It uncovered the Goldstone mode in structural phase transitions.
Discovered the approximate equality and phase difference of Cd and Re displacements.
Abstract
The information content of crystalline materials becomes astronomical when collective electronic behavior and their fluctuations are taken into account. In the past decade, improvements in source brightness and detector technology at modern x-ray facilities have allowed a dramatically increased fraction of this information to be captured. Now, the primary challenge is to understand and discover scientific principles from big data sets when a comprehensive analysis is beyond human reach. We report the development of a novel unsupervised machine learning approach, XRD Temperature Clustering (X-TEC), that can automatically extract charge density wave (CDW) order parameters and detect intra-unit cell (IUC) ordering and its fluctuations from a series of high-volume X-ray diffraction (XRD) measurements taken at multiple temperatures. We apply X-TEC to XRD data on a quasi-skutterudite family…
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