Characterizing ultra-low emittance electron beams using structured light fields

TL;DR

This paper introduces a novel laser-based method for single-shot, high-sensitivity characterization of ultra-low emittance electron beams, overcoming limitations of traditional techniques in resolving sub 0.1 mm mrad emittances.

Contribution

The paper presents a new interferometric laser scheme for measuring ultra-low emittance electron beams with high sensitivity and single-shot capability.

Findings

Effective in simulating normalized emittances from 0.01 to 1 mm mrad.

Uses laser interference patterns to modulate electron beam phase space.

Demonstrates potential for improved beam diagnostics in advanced accelerators.

Abstract

Novel schemes for generating ultra-low emittance electron beams have been developed in the last years and promise compact particle sources with excellent beam quality suitable for future high-energy physics experiments and free-electron lasers. Current methods for the characterization of low emittance electron beams such as pepperpot measurements or beam focus scanning are limited in their capability to resolve emittances in the sub $0.1$ mm mrad regime. Here we propose a novel, highly sensitive method for the single shot characterization of the beam waist and emittance using interfering laser beams. In this scheme, two laser pulses are focused under an angle creating a grating-like interference pattern. When the electron beam interacts with the structured laser field, the phase space of the electron beam becomes modulated by the laser ponderomotive force and results in a modulated beam profile after further electron beam phase advance, which allows for the characterization of ultra-low emittance beams. 2D PIC simulations show the effectiveness of the technique for normalized emittances in the range of $\epsilon_n=[0.01,1]$ mm mrad.