Single-Hemisphere Photoelectron Momentum Microscope With Time-of-Flight Recording
G. Schoenhense, S. Babenkov, D. Vasilyev, H.-J. Elmers, K. Medjanik

TL;DR
This paper introduces a novel photoelectron momentum microscope using a single hemispherical analyzer combined with time-of-flight detection, enabling full half-space momentum mapping with high energy resolution and improved efficiency for ARPES applications.
Contribution
It presents a new approach for momentum mapping of the full half-space using a single hemispherical analyzer and hybrid ToF mode, enhancing resolution and efficiency over previous methods.
Findings
Achieved 7.7 meV energy resolution with an unfocused He lamp.
Demonstrated effective k-imaging of quantum-well states in Au and Xe multilayers.
Developed a hybrid dispersive-plus-ToF mode for 3D data acquisition.
Abstract
Photoelectron momentum microscopy is an emerging powerful method for angle-resolved photoelectron spectroscopy (ARPES), especially in combination with imaging spin filters. These instruments record kx-ky images, typically exceeding a full Brillouin zone. As energy filters double-hemispherical or time-of-flight (ToF) devices are in use. Here we present a new approach for momentum mapping of the full half-space, based on a single hemispherical analyzer (path radius 225 mm). Excitation by an unfocused He lamp yielded an energy resolution of 7.7 meV. The performance is demonstrated by k-imaging of quantum-well states in Au and Xe multilayers. The alpha-square-aberration term (alpha: entrance angle in the dispersive plane) and the transit-time spread of the electrons in the spherical field are studied in a large pass-energy (6 to 660 eV) and angular range (alpha up to about 7{\deg}). It is…
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