Order-Disorder Behavior at Thin Film Oxide Interfaces
Steven R. Spurgeon

TL;DR
This paper reviews recent research on the order-disorder phenomena at thin film oxide interfaces, emphasizing synthesis and irradiation effects, and highlights future research directions in this evolving field.
Contribution
It provides a comprehensive survey of recent studies on order-disorder behavior at oxide interfaces, focusing on synthesis and irradiation conditions, and suggests future research pathways.
Findings
Order can emerge during synthesis processes.
Disorder increases under extreme irradiation environments.
Interface dynamics are crucial for oxide properties.
Abstract
Order-disorder processes fundamentally determine the structure and properties of many important oxide systems for energy and computing applications. While these processes have been intensively studied in bulk materials, they are less investigated and understood for nanostructured oxides in highly non-equilibrium conditions. These systems can now be realized through a range of deposition techniques and probed at exceptional spatial and chemical resolution, leading to a greater focus on interface dynamics. Here we survey a selection of recent studies of order-disorder behavior at thin film oxide interfaces, with a particular emphasis on the emergence of order during synthesis and disorder in extreme irradiation environments. We summarize key trends and identify directions for future study in this growing research area.
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