A Photonic Atom Probe coupling 3D Atomic Scale Analysis with in situ Photoluminescence Spectroscopy

TL;DR

This paper presents a novel photonic atom probe that combines 3D atomic-scale analysis with in situ photoluminescence spectroscopy, enabling simultaneous structural and optical characterization of materials at the atomic level.

Contribution

The work introduces a new instrument integrating laser-enhanced atom probe tomography with micro-Photoluminescence, operating at high frequencies with tunable laser pulses for combined analysis.

Findings

Successful coupling of atom probe with in situ PL spectroscopy.

Capability to analyze semiconductor heterostructures at atomic resolution.

Potential for advanced materials characterization combining structural and optical data.

Abstract

Laser enhanced field evaporation of surface atoms in Laser-assisted Atom Probe Tomography (La-APT) can simultaneously excite phtotoluminescence in semiconductor or insulating specimens. An atom probe equipped with appropriate focalization and collection optics has been coupled with an in-situ micro-Photoluminescence ({\mu}PL) bench that can be operated during APT analysis. The Photonic Atom Probe instrument we have developped operates at frequencies up to 500 kHz and is controlled by 150 fs laser pulses tunable in energy in a large spectral range (spanning from deep UV to near IR). Micro-PL spectroscopy is performed using a 320 mm focal length spectrometer equipped with a CCD camera for time-integrated and with a streak camera for time-resolved acquisitions. An exemple of application of this instrument on a multi-quantum well oxide heterostructure sample illustrates the potential of this new generation of tomographic atom probe.