Tomographic Reconstruction using Tilted Laue Analyser Based X-ray Phase-Contrast Imaging

TL;DR

This paper introduces a novel tilted Laue analyser method in X-ray phase-contrast imaging that enhances phase sensitivity from 1-D to 2-D, enabling accurate tomographic reconstruction of complex samples.

Contribution

It presents a new inclined geometry approach in Laue-based ABPCI to achieve 2-D phase sensitivity and demonstrates its effectiveness through tomographic imaging.

Findings

Achieved 2-D phase sensitivity in Laue ABPCI

Successfully reconstructed real and imaginary refractive index parts

Performed 360-degree tomography on a multi-material phantom

Abstract

Analyser-Based Phase-Contrast imaging (ABPCI) is a phase-contrast imaging method that produces high contrast images of weakly absorbing materials. However, it is only sensitive to phase variations lying in the diffraction plane of the analyser crystal (i.e in one dimension; 1-D), as it is highly sensitive to phase variations lying in the diffraction plane of the analyser crystal. In order to accurately account for and measure phase effects produced by the wavefield-sample interaction, ABPCI and other 1-D phase sensitive methods must achieve 2-D phase sensitivity. We applied an inclined geometry method to a Laue geometry setup for X-ray ABPCI through rotation of the detector and object about the optical axis. This allowed this traditionally 1-D phase sensitive phase contrast method to possess 2-D phase sensitivity. We acquired tomographic datasets over 360 degrees of a multi-material phantom with the detector and sample tilted by 8 degrees. The real and imaginary parts of the refractive index were reconstructed for the phantom.