Fault-tolerant measurement-free quantum error correction with multi-qubit gates
Michael A. Perlin, Vickram N. Premakumar, Jiakai Wang, Mark Saffman,, Robert Joynt

TL;DR
This paper investigates fault-tolerance in measurement-free quantum error correction using multi-qubit gates, revealing challenges with existing gates and proposing a new fault-tolerant scheme with improved thresholds.
Contribution
It identifies overlooked errors in MFQEC, introduces a simulation method for fault-tolerance analysis, and proposes a measurement-free, fault-tolerant Steane code variant with enhanced pseudothreshold.
Findings
Revised MFQEC circuit resistant to all single-qubit errors
Pseudothreshold of ~0.7% under restricted noise model
Measurement-free FT Steane code with ~0.1% pseudothreshold
Abstract
Measurement-free quantum error correction (MFQEC) offers an alternative to standard measurement-based QEC in platforms with an unconditional qubit reset gate. We revisit the question of fault tolerance (FT) for a measurement-free variant of the Steane code that leverages multi-qubit gates and redundant syndrome extraction, finding previously overlooked phase-flip errors that undermine FT. We then construct a revised MFQEC circuit that is resistant to all single-qubit errors, but which nonetheless cannot tolerate certain correlated errors. In order to investigate FT systematically, we introduce an efficient method to classically simulate MFQEC circuits with (i) Clifford gates for syndrome extraction, (ii) syndrome-controlled Pauli operations for decoding, and (iii) a Pauli noise model. We thereby find a pseudothreshold of for our revised MFQEC Steane code under a restricted…
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Taxonomy
TopicsQuantum Computing Algorithms and Architecture · Semiconductor materials and devices · Advancements in Semiconductor Devices and Circuit Design
