The role of lengthscale in the creep of Sn-3Ag-0.5Cu solder microstructures
Tianhong Gu, Christopher M. Gourlay, and T. Ben Britton

TL;DR
This study investigates how microstructural lengthscale influences creep behavior in Sn-3Ag-0.5Cu solder, revealing that finer microstructures enhance creep performance and alter deformation mechanisms across temperature ranges.
Contribution
It provides new insights into the effect of microstructural lengthscale on creep mechanisms and deformation behavior in SAC305 solder.
Findings
Refined microstructure improves creep lifetime and ductility.
Creep mechanism shifts from obstacle-controlled dislocation to vacancy diffusion with temperature.
Microstructural lengthscale affects recrystallized grain size and deformation heterogeneity.
Abstract
Creep of directionally solidified Sn-3Ag-0.5Cu wt.% (SAC305) samples with near-<110> orientation along the loading direction and different microstructural lengthscale is investigated under constant load tensile testing and at a range of temperatures. The creep performance improves by refining the microstructure, i.e. the decrease in secondary dendrite arm spacing ({\lambda}2), eutectic intermetallic spacing ({\lambda}e) and intermetallic compound (IMC) size, indicating as a longer creep lifetime, lower creep strain rate, change in activation energy (Q) and increase in ductility and homogeneity in macro- and micro-structural deformation of the samples. The dominating creep mechanism is obstacle-controlled dislocation creep at room temperature and transits to lattice-associated vacancy diffusion creep at elevated temperature (T/T_M > 0.7 to 0.75). The deformation mechanisms are…
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