Monitoring morphological and chemical properties during silver solid-state dewetting

TL;DR

This study investigates how silver thin films undergo morphological and chemical changes during solid-state dewetting, using advanced surface analysis techniques to better understand and control the process for technological applications.

Contribution

It introduces a multidisciplinary approach combining X-ray photoemission spectroscopy and atomic force microscopy to analyze surface chemistry and morphology during silver dewetting.

Findings

Surface chemistry and morphology are simultaneously monitored during annealing.

Power spectral density analysis separates long- and short-range surface behaviors.

The approach provides detailed statistical information relevant for applications.

Abstract

Solid-state dewetting phenomenon in silver thin films offers a straightforward method to obtain structures having controlled shape or size -this latter in principle spanning several orders of magnitudes -- with potentially strong interest in many applications involving high-tech industry and biomedicine. In this work nanostructured silver is deposited by pulsed electron ablation technique and its surface modified upon thermal treatments in air at increasing temperatures. Surface chemistry and morphology are then monitored simultaneously by X-ray photoemission spectroscopy and atomic force microscopy; in particular, the power spectral density of surface heights is used to analyze the alteration of morphology induced by annealing. It is shown that this approach adds a level of information about the dewetting process since it allows to separate between long- and short-range surface behavior and to retrieve statistical quantities relevant to a description of the features in view of applications. Our results are presented in the framework of a multidisciplinary approach, advantages and limits of which are deepened and discussed.