Clarifying multiple-tip effects on Scanning Tunneling Microscopy imaging of 2D periodic objects and crystallographic averaging in the spatial frequency domain
Jack C. Straton, Peter Moeck, Bill Moon Jr., and Taylor T. Bilyeu

TL;DR
This paper analyzes how multiple-tip effects influence STM imaging of 2D periodic objects, using Fourier analysis and surface wave functions to clarify the effectiveness and limitations of crystallographic image processing techniques.
Contribution
It introduces a simplified derivation of the current for multiple tips in STM and explores tip-separation effects on image obscuration and quantum interference patterns.
Findings
Fourier spectrum reveals tip-separation dependence of image artifacts
Quantum interference produces macroscopic bands distinct from classical patterns
CIP effectively removes multiple tip effects within certain spatial separations
Abstract
Crystallographic image processing (CIP) techniques may be utilized in scanning probe microscopy (SPM) to glean information that has been obscured by signals from multiple probe tips. This may be of particular importance for scanning tunneling microscopy (STM) and requires images from a sample that is periodic in two dimensions. The image-forming current for multiple tips in STM is derived in a more straightforward manner than prior approaches. The Fourier spectrum of the current for p4mm Bloch surface wave functions and a pair of delta function tips reveals the tip-separation dependence of various types of image obscurations. In particular our analyses predict that quantum interference should be visible on a macroscopic scale in the form of bands quite distinct from the basket-weave patterns a purely classical model would create at the same periodic double STM tip separations. A surface…
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Taxonomy
TopicsForce Microscopy Techniques and Applications · Surface and Thin Film Phenomena · Quantum and electron transport phenomena
